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Center for Railway Research

Studying, developing, and applying new and emerging technologies to solve rail industry problems.

Research Topics

Illustration of a railhead with labels for internal railhead crack, test specimen, and the x and z axes.

Computational Modeling of Fracture in Rails 

Computer Prediction of Buckling in Rails 

Experimental Determination of Crack Growth in Rails Subjected to Long-Term Cyclic Fatigue Loading 

Experimental Determination of Track Structure Properties 

Visuals

Photos

  • Illustration of railhead with labels identifying: uniaxial cyclic loading simulating rail cars and RNT, internal railhead crack, and the x, y, and z axes.
  • Photograph with the following items identified: vertical load actuator, horizontal displacement LVDT (vertical displacement LVDT not show in photo), vertical load cell, crosstie (shown: HDPE with dimples), aggregate (and plastic shown for wet experiments), pusher load cell, and pushing actuator.
  • Illustration of a railhead with labels for internal railhead crack, test specimen, and the x and z axes.
  • Photograph of a broken rail.
  • Illustration of a railhead with labels for internal railhead crack, test specimen, and the x, y and z axes.
  • Illustration of a railway with labels for cross ties, track fasteners, damaged rail, ballast, base material, and the x, y and z axes.
  • Rail Tests/Simulations

    • Rail test graph example.
    • Rail test graph example.
    • Line graph showing crack area vs. kilocycles for Rail numbers 1, 4, 5, 6, and 7.
    • Line graph showing buckling load vs. lateral trackwalk change for delta T equals 0, delta T equals 15, and delta T equals 30 degrees Fahrenheit.
    • Line graph showing tie force [kips] vs. tie displacement [in].
    • Line graph showing buckling load vs. rotational stiffness change - lift off.
    • Line graph showing buckling load vs. rotational stiffness change.
    • Line graph showing lateral buckling load vs. temperature change.
    • Comparison of crack progression in each rail tested.

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